Paper Title
The Effect of Thickness and Extracting Technique for Dielectric Properties

Abstract
The differences between extracting and measurement methods are presented which are used at millimeter wave frequency band (Ka and W bands), in this study. The common using measurement methods (Free Space Measurement, Waveguide, Coaxial Probe, and Resonant Cavity) are described with their features. In addition, the advantage of Newton-Raphson extracting technique is presented. Furthermore, the thickness effect is showed in process of obtaining the dielectric constant at Ka-band. Index Terms—Dielectric constant, free space measurement, genetic algorithm, newton-raphson method.