International Journal of Advances in Electronics and Computer Science ( IJAECS )
A highly rated peer reviewed monthly International Journal
Editor-in-Chief : Dr. P. Suresh
Contact Person : Technical Editor
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Publisher:IRAJ
ISSN (p): 2394-2835
Issues /Year :12
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Paper Detail


Paper Title
Ontology based Methodology to Enrich Functional Test Coverage in Software Applications

Abstract
Software development organizations battle in determining the functional test coverage prior to the delivery of software applications to the client and is purely depended on the tester’s knowledge of the software. This paper presents a methodology to minimize tester knowledge dependency introducing partial automation of the test design process using ontology and semantic querying. Keywords - Ontology, Semantic Querying, Functional Testing, Model Based Testing


Author - K. S. A. W. Gunawardena, K. Y. Bandara, N. D. Kodikara

Published : Volume-5,Issue-2  ( Feb, 2018 )


DOIONLINE Number - IJAECS-IRAJ-DOIONLINE-11119   View Here

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| Published on 2018-04-11
   
   
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