Paper Title :Thickness Dependent of Electrical Properties of Un-doped ZnO Thin Films
Author :Subrata Majumder
Article Citation :Subrata Majumder ,
(2019 ) " Thickness Dependent of Electrical Properties of Un-doped ZnO Thin Films " ,
International Journal of Mechanical and Production Engineering (IJMPE) ,
pp. 24-25,
Volume-7,Issue-7
Abstract : The present paper reports the thickness dependent resistivity measurement studies in undoped ZnO thin films. The ZnO thin films were grown by physical vapor deposition technique. During the film growth the nano crystalline films accumulated a considerable amount of oxygen vacancies. The results demonstrate the oxygen vacancy controlled resistive behavior of ZnO thin films. These surprising findings are very important and crucial for developing ZnO based sensors and will help in related areas of research. Keywords - AFM, ZnO, Resistivity
Type : Research paper
Published : Volume-7,Issue-7
DOIONLINE NO - IJMPE-IRAJ-DOIONLINE-15845
View Here
Copyright: © Institute of Research and Journals
|
|
| |
|
PDF |
| |
Viewed - 64 |
| |
Published on 2019-09-11 |
|